SDG3000X — 200–500 MHz AWG for Semiconductor and RF Testing
High-bandwidth dual-channel AWG to 500 MHz — 16-bit DAC, 2.4 GSa/s, wideband noise and IQ modulation for semiconductor test, ADC characterisation and advanced signal stimulus.
| Model | Max Frequency | DAC | Sample Rate |
|---|---|---|---|
| SDG3032X | 200 MHz | 16-bit | 2.4 GSa/s |
| SDG3052X | 500 MHz | 16-bit | 2.4 GSa/s |
Key Features
500 MHz — Semiconductor and RF Stimulus
500 MHz bandwidth with 16-bit DAC and 2.4 GSa/s for high-fidelity semiconductor characterisation and RF component testing.
16-bit DAC — Low Spurious Output
65,536 amplitude levels and low SFDR for clean carrier generation in receiver testing where harmonic products must be well below signal level.
Wideband Noise Generation
Generate wideband Gaussian noise for noise immunity testing and ADC noise characterisation.
IQ Modulation Output
I and Q channel output for complex baseband signal generation up to 500 MHz.
Specifications
| Parameter | Unit | Value / Description |
|---|---|---|
| FREQUENCY | ||
| Max frequency | MHz | 200 (SDG3032X) · 500 (SDG3052X) |
| DAC | bit | 16 |
| Sample rate | GSa/s | 2.4 |
| Arb depth | pts | Up to 64 M |
Applications
IC Output Testing
16-bit precision stimulus for ADC and DAC acceptance testing.
RF Receiver Stimulus
500 MHz carrier for receiver sensitivity testing.
ENOB and SNR Measurement
High-fidelity sinusoidal input for ADC characterisation.
Complex Waveform Experiment
Upload arbitrary sequences from MATLAB or Python.
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